DocumentCode
1401400
Title
Analysis of the flow of encapsulant during underfill encapsulation of flip-chips
Author
Han, Sejin ; Wang, K.K.
Author_Institution
Sibley Sch. of Mech. & Aerosp. Eng., Cornell Univ., Ithaca, NY, USA
Volume
20
Issue
4
fYear
1997
fDate
11/1/1997 12:00:00 AM
Firstpage
424
Lastpage
433
Abstract
In this paper, the flow of encapsulant during the underfill encapsulation of flip-chips has been studied. Analytical as well as numerical methods have been developed to analyze the flow. For capillary-driven encapsulation (by dispensing), the capillary force at the melt-front has been calculated based on a model for the melt-front shape. A model has also been developed for the analysis of forced-injection encapsulation. The numerical analysis uses a finite-element method based on a generalized Hele-Shaw method for solving the flow field. Experiments have been performed to investigate the flow behavior using actual chips and encapsulants. Short-shot runs have been performed to observe the melt-front advancement at different flow times. In addition, measurements have been made of the material properties of the encapsulant, namely its viscosity, curing kinetics and surface-tension coefficient. The experimental and simulation results have been compared in terms of the flow-front shapes and times at different fill fractions. Such comparisons indicate that the model developed in this study is adequate to approximately simulate the flow during encapsulation of flip chips
Keywords
encapsulation; finite element analysis; flip-chip devices; flow simulation; packaging; surface tension; viscosity; capillary force; capillary-driven encapsulation; curing kinetics; encapsulant flow analysis; finite-element method; flip-chips; flow field; forced-injection encapsulation; generalized Hele-Shaw method; material properties; melt-front shape model; numerical methods; surface-tension coefficient; underfill encapsulation; viscosity; Curing; Encapsulation; Finite element methods; Flip chip; Kinetic theory; Material properties; Numerical analysis; Semiconductor device measurement; Shape; Viscosity;
fLanguage
English
Journal_Title
Components, Packaging, and Manufacturing Technology, Part B: Advanced Packaging, IEEE Transactions on
Publisher
ieee
ISSN
1070-9894
Type
jour
DOI
10.1109/96.641511
Filename
641511
Link To Document