Title :
High-frequency overtone crystal units and their measurement
Author :
Miles, R.H.A. ; Stevenson, S.A.
Author_Institution :
General Electric Company Limited, Central Research Laboratories, Hirst Research Centre, Wembley, UK
fDate :
5/15/1905 12:00:00 AM
Abstract :
The upper frequencies for direct crystal control of oscillators have now been extended to over 100 Mc/s by the development of suitable crystals and circuits. The processes employed for the manufacture of these precision overtone oscillator plates are outlined and details of the methods of inspection are given. The measurement of electrical parameters is discussed and a new test set described. It is probable that at the very high frequencies complete packaged oscillators will be required. Details of such a unit are given.
Keywords :
crystal properties; frequency measurement;
Journal_Title :
Proceedings of the IEE - Part B: Electronic and Communication Engineering
DOI :
10.1049/pi-b-2.1962.0057
