DocumentCode
1401594
Title
High-frequency overtone crystal units and their measurement
Author
Miles, R.H.A. ; Stevenson, S.A.
Author_Institution
General Electric Company Limited, Central Research Laboratories, Hirst Research Centre, Wembley, UK
Volume
109
Issue
22
fYear
1962
fDate
5/15/1905 12:00:00 AM
Firstpage
328
Lastpage
332
Abstract
The upper frequencies for direct crystal control of oscillators have now been extended to over 100 Mc/s by the development of suitable crystals and circuits. The processes employed for the manufacture of these precision overtone oscillator plates are outlined and details of the methods of inspection are given. The measurement of electrical parameters is discussed and a new test set described. It is probable that at the very high frequencies complete packaged oscillators will be required. Details of such a unit are given.
Keywords
crystal properties; frequency measurement;
fLanguage
English
Journal_Title
Proceedings of the IEE - Part B: Electronic and Communication Engineering
Publisher
iet
ISSN
0369-8890
Type
jour
DOI
10.1049/pi-b-2.1962.0057
Filename
5244738
Link To Document