DocumentCode :
1401671
Title :
Pulse shortening causes in high power BWO and TWT microwave sources
Author :
Goebel, Dan M.
Author_Institution :
Hughes Telecommun. & Space Co., Torrance, CA, USA
Volume :
26
Issue :
3
fYear :
1998
fDate :
6/1/1998 12:00:00 AM
Firstpage :
263
Lastpage :
274
Abstract :
Pulse shortening, an effect where the microwave output power from a high-power tube terminates or significantly degrades well before the end of the electron beam pulse, severely limits the energy per pulse and average power capability of many high power microwave (HPM) sources. The cause of pulse shortening varies from device to device, and different causes can simultaneously contribute to the observed power reduction behavior which tends to obscure the underlying mechanisms and possible solutions. In this paper, we show a variety of experimental situations that lead to pulse shortening in HPM sources. The mechanisms of the different pulse shortening triggers are examined in detail in high-vacuum traveling wave tubes (TWT) and plasma-filled backward-wave oscillators (BWO). We find that there are many different causes of pulse shortening such as arcing, mode competition, beam instability, etc. However, the most commonly observed situation that leads to pulse shortening is the combination of sufficiently high power electron beams and poor vacuum conditions that lead to plasma generation. The presence of plasma significantly modifies the beam coupling to the circuit, which can affect the microwave production efficiency on very short time scales. The situations lending to pulse shortening and possible solutions are presented
Keywords :
arcs (electric); backward wave oscillators; microwave generation; microwave oscillators; plasma devices; plasma production; travelling wave tubes; vacuum tubes; BWO microwave sources; HPM sources; TWT microwave sources; arcing; average power capability; beam coupling; beam instability; electron beam pulse; energy per pulse; high power electron beams; high power microwave sources; high-power tube; high-vacuum traveling wave tubes; microwave output power; microwave production efficiency; microwave sources; mode competition; plasma generation; plasma-filled backward-wave oscillators; power reduction behavior; pulse shortening; pulse shortening trigger; vacuum conditions; Degradation; Electron beams; Electron tubes; High power microwave generation; Microwave devices; Oscillators; Plasma sources; Plasma waves; Power generation; Pulse generation;
fLanguage :
English
Journal_Title :
Plasma Science, IEEE Transactions on
Publisher :
ieee
ISSN :
0093-3813
Type :
jour
DOI :
10.1109/27.700753
Filename :
700753
Link To Document :
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