• DocumentCode
    1401705
  • Title

    Unilateral gain of heterojunction bipolar transistors at microwave frequencies

  • Author

    Prasad, Sheila ; Lee, Wai ; Fonstad, C.G.

  • Author_Institution
    Center for Mater. Sci. & Eng., MIT, Cambridge, MA, USA
  • Volume
    35
  • Issue
    12
  • fYear
    1988
  • fDate
    12/1/1988 12:00:00 AM
  • Firstpage
    2288
  • Lastpage
    2294
  • Abstract
    General expressions for the h parameters of small-signal equivalent circuit models for emitter-up and emitter-down heterojunction bipolar transistors (HBTs) are derived. The unilateral gain U is calculated from these h parameters for InGaAs/InAlAs n-p-n HBTs. When the device parasitics are sufficiently reduced, the unilateral gain is found to exhibit a resonance behavior at high frequencies that deviates from the traditionally assumed 6-dB/octave roll-off. This unusual behavior in the unilateral gain is found to be caused by the appearance of negative output conductance of the device in certain bands of frequencies. The occurrence of the negative output conductance is shown to be a transit-time effect, and its implication for the device performance at high frequencies is discussed
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; heterojunction bipolar transistors; indium compounds; solid-state microwave devices; transit time devices; HBTs; InGaAs-InAlAs; device parasitics; device performance; emitter-down HBT; emitter-up HBT; h parameters; heterojunction bipolar transistors; implication; microwave frequencies; negative output conductance; resonance behavior; semiconductors; small-signal equivalent circuit models; transit-time effect; unilateral gain; Capacitance; Contact resistance; Equivalent circuits; Estimation theory; Frequency estimation; Heterojunction bipolar transistors; Indium gallium arsenide; Materials science and technology; Microwave frequencies; Resonance;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.8804
  • Filename
    8804