• DocumentCode
    1401755
  • Title

    Reduction of EEDF Measurement Distortion in Regularized Solutions of the Druyvesteyn Relation

  • Author

    El Saghir, Ahmed ; Shannon, Steven

  • Author_Institution
    North Carolina State Univ., Raleigh, NC, USA
  • Volume
    39
  • Issue
    1
  • fYear
    2011
  • Firstpage
    596
  • Lastpage
    602
  • Abstract
    Electron energy distribution function (EEDF) extraction from Langmuir probe data is an ill-posed problem due to the integral relationship between electron current and probe voltage. Both curve fitting of experimental data and reconstruction of the integral problem through methods, such as Tikhonov regularization, address this to some measure, with regularized solutions offering an advantage in overall EEDF accuracy over curve fitting. Although Tikhonov regularization provides a more accurate estimation of EEDF overall energy space, it typically also can distort the overall shape of the reconstructed distribution, particularly at high energies and energies below the distribution peak. This, combined with the relative ease of use that simple data smoothing algorithms provide, has limited the use of the more advanced reconstruction algorithms in EEDF analysis. In this paper, we will shed some light on these limitations and offer an alternative method to overcome these limitations.
  • Keywords
    Langmuir probes; curve fitting; physics computing; smoothing methods; Druyvesteyn relation; EEDF measurement distortion; Langmuir probe; Tikhonov regularization; curve fitting; data smoothing algorithms; electron current; electron energy distribution function; ill-posed problem; integral problem; probe voltage; reconstruction algorithms; regularized solutions; Distortion measurement; Distribution functions; Electric potential; Kernel; Plasmas; Probes; Signal to noise ratio; Electron energy distribution function (EEDF); Tikhonov regularization; ill-posed problems; truncated singular value decomposition (TSVD);
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2010.2090906
  • Filename
    5665778