DocumentCode
1401774
Title
Analysis of charge control in pseudomorphic two-dimensional electron gas field-effect transistors
Author
Ando, Yuji ; Itoh, Tomohiro
Author_Institution
NEC Corp., Kawasaki, Japan
Volume
35
Issue
12
fYear
1988
fDate
12/1/1988 12:00:00 AM
Firstpage
2295
Lastpage
2301
Abstract
An exact model for charge control in two-dimensional field-effect transistors (2DEGFETs) is discussed. The model is based on a first-principles theory, in which self-consistent quantum two-dimensional electron subbands and numerical solutions of Poisson´s equation for band bending, space charge, and three-dimensional holes are included. The charge control in InGaAs/AlGaAs pseudomorphic 2DEGFETs is analyzed and compared with that in the GaAs/AlGaAs conventional 2DEGFET. It is shown that a quantum-well channel in the pseudomorphic 2DEGFET can achieve high carrier confinement as well as high carrier concentration. From the calculated gate capacitance-voltage behavior, a simple estimation for the device performance is obtained. The results indicate that the pseudomorphic 2DEGFET with a large conduction band discontinuity at the channel interface can improve transconductance-gate voltage characteristics, and thus maximum transconductance, and the cutoff frequency-gate voltage characteristics
Keywords
III-V semiconductors; aluminium compounds; gallium arsenide; high electron mobility transistors; indium compounds; semiconductor device models; solid-state microwave devices; 2DEGFETs; GaAs-AlGaAs; HEMTs; InGaAs-AlGaAs; Poisson´s equation; TEGFETs; band bending; channel interface; charge control; cutoff frequency-gate voltage characteristics; device performance; exact model; first-principles theory; gate capacitance-voltage behavior; high carrier concentration; high carrier confinement; maximum transconductance; models; numerical solutions; pseudomorphic 2DEGFETs; quantum-well channel; self-consistent quantum two-dimensional electron subbands; semiconductors; space charge; three-dimensional holes; transconductance-gate voltage characteristics; two-dimensional electron gas field-effect transistors; Carrier confinement; Charge carrier processes; FETs; Gallium arsenide; Indium gallium arsenide; Poisson equations; Quantum mechanics; Quantum well devices; Space charge; Voltage;
fLanguage
English
Journal_Title
Electron Devices, IEEE Transactions on
Publisher
ieee
ISSN
0018-9383
Type
jour
DOI
10.1109/16.8805
Filename
8805
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