DocumentCode :
1402224
Title :
Reliability of tantalum-foil-type electrolytic capacitors
Author :
Smith, E.E.
Volume :
109
Issue :
22
fYear :
1962
fDate :
5/15/1905 12:00:00 AM
Firstpage :
543
Lastpage :
547
Abstract :
Tantalum-foil-type capacitors are being increasingly used owing to their very good space factor (up to 10000¿F/in3) and excellent long-term performance. The paper examines briefly the factors affecting the reliability of electrolytic capacitors, particularly the tantalum type, and discusses the main potential failure mechanisms. Detailed results of tests of up to 3 years´ duration on tantalum-foil capacitors at temperatures of up to 85° C, and with a voltage stress of up to 75% initial forming stress, are presented. These results are analysed to demonstrate the effect on reliability of operating stress and operating temperature.
Keywords :
quality control; testing;
fLanguage :
English
Journal_Title :
Proceedings of the IEE - Part B: Electronic and Communication Engineering
Publisher :
iet
ISSN :
0369-8890
Type :
jour
DOI :
10.1049/pi-b-2.1962.0093
Filename :
5244918
Link To Document :
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