• DocumentCode
    1402261
  • Title

    A 1-V 46-ns 16-Mb SOI-DRAM with body control technique

  • Author

    Shimomura, Ken´ichi ; Shimano, Hiroki ; Sakashita, Narumi ; Okuda, Fumihiro ; Oashi, Toshiyuki ; Yamaguchi, Yasuo ; Eimori, Takahisa ; Inuishi, Masahide ; Arimoto, Kazutami ; Maegawa, Shigeto ; Inoue, Yasuo ; Komori, Shinji ; Kyuma, Kazuo

  • Author_Institution
    Adv. Technol. R&D Center, Mitsubishi Electr. Corp., Hyogo, Japan
  • Volume
    32
  • Issue
    11
  • fYear
    1997
  • fDate
    11/1/1997 12:00:00 AM
  • Firstpage
    1712
  • Lastpage
    1720
  • Abstract
    A low-voltage high-speed 16-Mb SOI-DRAM has been developed using a 0.5-μm CMOS/SIMOX technology. A newly introduced “FD-PD mode switching” transistor dynamically switches its operation mode between fully depleted (FD) and partially depleted (PD) according to the body bias voltage, thus it has both PD-mode large current drivability and FD-mode small leakage current. By the body bias control, the transistor operates as if it has an S-factor of 30 mV/decade. Enabling both high speed and low power at a low voltage, 30 mV is only one-half the theoretical value. By utilizing the transistor, we have developed body pulsed sense amplifier (BPS), body driven equalizer (BDEQ), body current clamper (BCC), and body pulsed transistor logic (BPTL) to achieve 46 ns access time at 1 V power supply with suppressed standby current
  • Keywords
    CMOS memory circuits; DRAM chips; SIMOX; 0.5 micron; 1 V; 16 Mbit; 46 ns; CMOS/SIMOX technology; FD-PD mode switching transistor; S-factor; body control; body current clamper; body driven equalizer; body pulsed sense amplifier; body pulsed transistor logic; current drivability; fully depleted mode; leakage current; low-voltage high-speed SOI-DRAM; partially depleted mode; CMOS technology; Emergency power supplies; Equalizers; Leakage current; Logic; Low voltage; Power amplifiers; Pulse amplifiers; Pulsed power supplies; Switches;
  • fLanguage
    English
  • Journal_Title
    Solid-State Circuits, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9200
  • Type

    jour

  • DOI
    10.1109/4.641691
  • Filename
    641691