Title :
Microchannel cooling for a high-energy particle transmission window, an RF transmission window, and VLSI heat dissipation
Author :
Vidmar, Robert J. ; Barker, Robert J.
Author_Institution :
SRI Int., Menlo Park, CA, USA
fDate :
6/1/1998 12:00:00 AM
Abstract :
The transmission of energetic particles from vacuum to atmospheric pressure through a window results in some energy deposition within the window. This energy heats the window, increases its temperature, reduces its mechanical strength, and so limits the particle flux through the window. An analysis of heat transport indicates that a transmission window that incorporates microchannel cooling within the window can increase its heat dissipation, thereby increasing beam flux by several orders of magnitude. This increase occurs because the convective heat-transfer coefficient can increase to ~1 MW/m2×K for fully developed turbulence in 131 μm diameter capillary tubing. Mechanical and thermal constraints are discussed, as well as the hydraulic system necessary to achieve appropriate fluid flow. Experimental heat dissipation using 131 μm capillary tubes in a seven-tube manifold implies that a 5 cm diameter foil window could dissipate 2.7 kW/cm2 continuously. Design examples include a 30 mA/cm2 electron-beam window, a 722 W/cm2 RF window, and 950 W/cm2 very large scale integration (VLSI) cooling
Keywords :
VLSI; cooling; integrated circuit packaging; semiconductor device packaging; RF transmission window; VLSI heat dissipation; beam flux; capillary tubing; convective heat-transfer coefficient; electron-beam window; energy deposition; fully developed turbulence; heat dissipation; heat transport; high-energy particle transmission window; hydraulic system; mechanical constraints; mechanical strength; microchannel cooling; particle flux; seven-tube manifold; thermal constraints; very large scale integration; window heating; Cooling; Dielectric losses; Heat sinks; Heating; Microchannel; Particle beams; Plasma temperature; Radio frequency; Thermal stresses; Very large scale integration;
Journal_Title :
Plasma Science, IEEE Transactions on