• DocumentCode
    1402267
  • Title

    Analysis and simulation of the quantum well injection transit time diode

  • Author

    Song, Inchae ; Pan, Dee-Son

  • Author_Institution
    Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
  • Volume
    35
  • Issue
    12
  • fYear
    1988
  • fDate
    12/1/1988 12:00:00 AM
  • Firstpage
    2315
  • Lastpage
    2322
  • Abstract
    The quantum-well injection transit time (QWITT) diode is simulated for two different injection phase angles (90° and 270°) at 60, 90, 200, and 300 GHz. Quantitative analysis of the output power and efficiency is carried out by including the velocity transient effect, the diffusion effect, and the carrier space-charge effect. The diffusion effect and the carrier space-charge effect degrade the output power and efficiency of the device. The velocity transient effect enhances the device performance for a 270° injection phase mode, but it renders the device useless for a 90° injection phase mode. In comparison with other microwave devices, a simple QWITT diode is a very promising device for millimeter-wave frequency application when it is used with a 270° injection phase angle. This is due to fast intrinsic frequency response time and extremely localized carrier injection mechanism as well as high transient velocity at a small distance. Because of the good efficiency of the QWITT diode, it is feasible to increase output power by integration of many QWITT diodes
  • Keywords
    microwave generation; microwave oscillators; semiconductor device models; semiconductor diodes; solid-state microwave devices; 60 to 300 GHz; EHF; MM-waves; QWITT diode; carrier space-charge effect; diffusion effect; efficiency; high transient velocity; injection phase angles; integration of many QWITT diodes; intrinsic frequency response time; localized carrier injection mechanism; millimeter-wave frequency; modelling; output power; quantum well injection transit time diode; simulation; velocity transient effect; Analytical models; Cutoff frequency; Delay; Dispersion; Frequency estimation; Impact ionization; Microwave devices; Millimeter wave technology; Power generation; Semiconductor diodes;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.8807
  • Filename
    8807