Title :
Software Assisted Digital RF Processor (DRP™) for Single-Chip GSM Radio in 90 nm CMOS
Author :
Staszewski, Roman ; Staszewski, Robert Bogdan ; Jung, Tom ; Murphy, Thomas ; Bashir, Imran ; Eliezer, Oren ; Muhammad, Khurram ; Entezari, Mitch
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
This paper proposes and describes a new software and application programming interface view of an RF transceiver. It demonstrates benefits of using highly programmable digital control logic in an RF wireless system realized in a digital nanoscale CMOS process technology. It also describes a microprocessor architecture design in Digital RF Processor (DRPTM) and how it controls calibration and compensation for process, temperature and voltage variations of the analog and RF circuits to meet the required RF performance. A few calibration examples to reduce a DCO bias current and improve device reliability, as well as to optimize transmit modulation and receive performance, are given. The presented circuits and techniques have enabled successful implementation of a commercial single-chip GSM radio in 90 nm CMOS.
Keywords :
CMOS logic circuits; cellular radio; microprocessor chips; DCO bias current; RF circuits; RF transceiver; RF wireless system; analog circuits; application programming interface view; device reliability; digital nanoscale CMOS process technology; microprocessor architecture design; programmable digital control logic; single-chip GSM radio; size 90 nm; software-assisted digital RF processor; transmit modulation; Application software; CMOS logic circuits; CMOS process; Calibration; Digital control; GSM; Logic programming; Programmable control; Radio frequency; Transceivers; All-digital phase-locked loop (ADPLL); RF; application programming interface (API); built-in self-test (BIST); calibration; compensation; digital processor; digitally-assisted analog; digitally-controlled oscillator (DCO); mobile phones; nanometer scale CMOS; software; software-defined radio (SDR); time-to-digital converter (TDC);
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2009.2036763