DocumentCode :
1402591
Title :
Characterization of Gas Conductance of a Thermal Device With a V-Groove Cavity
Author :
Chen, Chung-Nan
Author_Institution :
Inst. of Photonics & Commun., Nat. Kaohsiung Univ. of Appl. Sci., Kaohsiung, Taiwan
Volume :
33
Issue :
2
fYear :
2012
Firstpage :
275
Lastpage :
277
Abstract :
The gas conductance of a V-groove thermal sensor is characterized by the simulation of effective collisions inside the cavity and further verified by the measurements of frequency responses in vacuum and in air. The effective gap depths of a polysilicon microbolometer with an active area of 44 μm × 27 μm and a V-groove cavity of 48 μm × 45 μm were estimated as 4.37 and 4.24 μm by the respective calculations based on the simulation and measurement results which are much lower than those calculated by early models of published papers. The gas conductance of the sensor in atmosphere was further evaluated as 1.4 × 10-5 W/K which dominates the heat loss of the thermal sensor.
Keywords :
bolometers; microsensors; temperature sensors; V-groove cavity; V-groove thermal sensor; frequency response; gas conductance; polysilicon microbolometer; size 27 mum; size 44 mum; size 45 mum; size 48 mum; thermal device; Atmospheric modeling; Cavity resonators; Electron devices; Heat sinks; Solids; Thermal conductivity; Thermal sensors; Gas conductance; V-groove; microbolometer; polysilicon; thermal sensor;
fLanguage :
English
Journal_Title :
Electron Device Letters, IEEE
Publisher :
ieee
ISSN :
0741-3106
Type :
jour
DOI :
10.1109/LED.2011.2176712
Filename :
6108338
Link To Document :
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