Title :
A 250 MHz 14 dB-NF 73 dB-Gain 82 dB-DR Analog Baseband Chain With Digital-Assisted DC-Offset Calibration for Ultra-Wideband
Author :
Shih, Horng-Yuan ; Kuo, Chien-Nan ; Chen, Wei-Hsien ; Yang, Tzu-Yi ; Juang, Kai-Chenug
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao-Tung Univ., Hsinchu, Taiwan
Abstract :
A 250 MHz analog baseband chain for ultra-wideband was implemented in a 1.2 V 0.13 ¿ m CMOS process. The chip has an active area of 0.8 mm2. In the analog baseband, PGAs and filters are carried out by current-mode amplifiers to achieve wide bandwidth and wide dynamic range of gain, as well as low noise and high linearity. Besides, a current-mode Sallen-Key low-pass filter is adopted for effective rejection of out-of-band interferers. A 6 th-order Chebyshev low-pass filter realized in Gm-C topology is designed in the baseband chain for channel selection. Digitally-assisted DC-offset calibration improves second-order distortion of the entire chain. The design achieves a maximum gain of 73 dB and a dynamic range of 82 dB. Measured noise figure is 14 dB, an IIP3 of -6 dBV, and IIP2 of -5 dBV at the maximum gain mode. The analog baseband chain consumes 56.4 mA under supply of 1.2 V.
Keywords :
CMOS analogue integrated circuits; Chebyshev filters; amplifiers; current-mode circuits; electronics packaging; low-pass filters; ultra wideband communication; 6th-order Chebyshev low-pass filter; CMOS process; Gm-C topology; PGA; analog baseband chain; channel selection; current 56.4 mA; current-mode Sallen-Key low-pass filter; current-mode amplifiers; digital-assisted DC-offset calibration; frequency 250 MHz; gain 73 dB; noise figure 14 dB; second-order distortion; size 0.13 mum; voltage 1.2 V; Bandwidth; Baseband; CMOS process; Calibration; Dynamic range; Electronics packaging; Linearity; Low pass filters; Low-noise amplifiers; Ultra wideband technology; Analog filter; DC offset calibration; analog baseband; current-mode VGA; current-mode filter; ultra wideband;
Journal_Title :
Solid-State Circuits, IEEE Journal of
DOI :
10.1109/JSSC.2009.2036320