DocumentCode
1402730
Title
Accurate frequency-domain modeling and efficient circuit simulation of high-speed packaging interconnects
Author
Beyene, Wendemagagnehu T. ; Schutt-Ainé, José E.
Author_Institution
Hewlett-Packard EEsof Div., Westlake Village, CA, USA
Volume
45
Issue
10
fYear
1997
fDate
10/1/1997 12:00:00 AM
Firstpage
1941
Lastpage
1947
Abstract
The paper describes an efficient frequency-domain modeling and simulation method of a coupled interconnect system using scattering parameters. First, low-order rational approximations of the multiport scattering parameters are derived over a wide frequency range using a robust interpolation technique. The method applies frequency normalization, shift, and Householder QR orthogonalization to improve the stability and the accuracy when solving the resulting systems of equations. For interconnects characterized with frequency-dependent parasitic parameters, the order of the rational of approximation is reduced by using appropriate reference system. Then, the generated multiport pole-residue models are incorporated into a circuit simulator using recursive convolution. Thus, the method avoids explicit convolution, numerical transform, and artificial filtering of a large number of points that are often necessary in conventional approaches. Examples with experimental and simulated results are given to illustrate the method
Keywords
S-parameters; circuit analysis computing; frequency-domain analysis; integrated circuit interconnections; integrated circuit packaging; multiport networks; Householder QR orthogonalization; circuit simulation; coupled interconnect; frequency normalization; frequency shift; frequency-domain model; high-speed packaging interconnect; interpolation; low-order rational approximation; multiport pole-residue model; parasitic parameters; recursive convolution; scattering parameters; Circuit simulation; Circuit stability; Convolution; Coupling circuits; Equations; Frequency; Integrated circuit interconnections; Interpolation; Robustness; Scattering parameters;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/22.641798
Filename
641798
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