DocumentCode :
1402750
Title :
Spiral inductors and transmission lines in silicon technology using copper-damascene interconnects and low-loss substrates
Author :
Burghartz, Joachim N. ; Edelstein, Daniel C. ; Jenkiin, K.A. ; Kwark, Young H.
Author_Institution :
Res. Div., IBM Thomas J. Watson Res. Center, Yorktown Heights, NY, USA
Volume :
45
Issue :
10
fYear :
1997
fDate :
10/1/1997 12:00:00 AM
Firstpage :
1961
Lastpage :
1968
Abstract :
Spiral inductors and different types of transmission lines are fabricated by using copper (Cu)-damascene interconnects and high-resistivity silicon (HRS) or sapphire substrates. The fabrication process is compatible with the concepts of silicon device fabrication. Spiral inductors with 1.4-nH inductance have quality factors (Q) of 30 at 5.2 GHz and 40 at 5.8 GHz for the HRS and the sapphire substrates, respectively. 80-nH inductors have Q´s as high as 13. The transmission-line losses are near 4 dB/cm at 10 GHz for microstrips, inverted microstrips, and coplanar lines, which are sufficiently small for maximum line lengths within typical silicon-chip areas. This paper shows that inductors with high Q´s for lumped-element designs in the 1-10-GHz range and transmission lines with low losses for distributed-element designs beyond 10 GHz can be made available with the proposed adjustments to commercial silicon technology
Keywords :
MMIC; Q-factor; copper; inductors; integrated circuit interconnections; lumped parameter networks; silicon; substrates; transmission lines; 1 to 10 GHz; Al2O3; Si; coplanar line; copper-damascene interconnect; distributed-element design; fabrication; high-resistivity silicon; inverted microstrip; loss; low-loss substrate; lumped-element design; microstrip; quality factor; sapphire; silicon technology; spiral inductor; transmission line; Copper; Fabrication; Inductance; Inductors; Microstrip; Propagation losses; Q factor; Silicon devices; Spirals; Transmission lines;
fLanguage :
English
Journal_Title :
Microwave Theory and Techniques, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9480
Type :
jour
DOI :
10.1109/22.641804
Filename :
641804
Link To Document :
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