A new approach for the experimental circuit modeling of coupled interconnection structures based on causality

Author

Sercu, S. ; Martens, I.

Author_Institution

Dept. of Inf. Technol., Ghent Univ., Belgium

Volume

45

Issue

10

fYear

1997

fDate

10/1/1997 12:00:00 AM

Firstpage

1977

Lastpage

1981

Abstract

In this paper, a time-frequency-domain technique for the experimental circuit modeling of coupled interconnection structures and discontinuities is presented. The technique models and de-embeds all discontinuities and coupled substructures of the device under test (DUT) one by one, and is based on the principle of causality. Validation of each part of the model is done in the time domain, while all calculations are performed in the frequency domain. To validate the accuracy of the circuit models, measured reflection, transmission, and near- and far-end crosstalk are compared with simulated results

Keywords

integrated circuit interconnections; integrated circuit modelling; physics fundamentals; time-frequency analysis; causality; circuit model; coupled interconnections; crosstalk; device under test; discontinuity; reflection; time-frequency-domain technique; transmission; Circuit simulation; Circuit testing; Circuit topology; Coupling circuits; Crosstalk; Integrated circuit interconnections; Reflection; Time domain analysis; Transmission line discontinuities; Transmission line measurements;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.641807

Filename

641807