DocumentCode :
140346
Title :
Feature extraction with stacked autoencoders for epileptic seizure detection
Author :
Supratak, Akara ; Ling Li ; Yike Guo
Author_Institution :
Dept. of Comput., Imperial Coll. London, London, UK
fYear :
2014
fDate :
26-30 Aug. 2014
Firstpage :
4184
Lastpage :
4187
Abstract :
Scalp electroencephalogram (EEG), a recording of the brain´s electrical activity, has been used to diagnose and detect epileptic seizures for a long time. However, most researchers have implemented seizure detectors by manually hand-engineering features from observed EEG data, and used them in seizure detection, which might not scale well to new patterns of seizures. In this paper, we investigate the possibility of utilising unsupervised feature learning, the recent development of deep learning, to automatically learn features from raw, unlabelled EEG data that are representative enough to be used in seizure detection. We develop patient-specific seizure detectors by using stacked autoencoders and logistic classifiers. A two-step training consisting of the greedy layer-wise and the global fine-tuning was used to train our detectors. The evaluation was performed by using labelled dataset from the CHB-MIT database, and the results showed that all of the test seizures were detected with a mean latency of 3.36 seconds, and a low false detection rate.
Keywords :
bioelectric potentials; electroencephalography; feature extraction; medical disorders; medical signal processing; neurophysiology; skin; unsupervised learning; CHB-MIT database; brain electrical activity recording; deep learning; epileptic seizure detection; epileptic seizure diagnosis; feature extraction; logistic classifiers; manually hand-engineering features; patient-specific seizure detectors; scalp electroencephalogram; stacked autoencoders; two-step training; unlabelled EEG data; unsupervised feature learning; Detectors; Electroencephalography; Feature extraction; Logistics; Scalp; Sensitivity; Training; deep learning; epileptic seizures; scalp electroencephalogram; stacked autoencoders; unsupervised feature learning;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
ISSN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2014.6944546
Filename :
6944546
Link To Document :
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