Title :
New Transient Detection Circuit for On-Chip Protection Design Against System-Level Electrical-Transient Disturbance
Author :
Ker, Ming-Dou ; Yen, Cheng-Cheng
Author_Institution :
Dept. of Electron. Eng., I-Shou Univ., Kaohsiung, Taiwan
Abstract :
A new transient detection circuit for on-chip protection design against system-level electrical-transient disturbance is proposed in this paper. The circuit function to detect positive or negative electrical transients under system-level electrostatic-discharge (ESD) and electrical-fast-transient (EFT) testing conditions has been investigated by HSPICE simulation and verified in silicon chip. The experimental results in a 0.18-μm complementary-metal-oxide-semiconductor (CMOS) process have confirmed that the new proposed on-chip transient detection circuit can successfully memorize the occurrence of system-level electrical-transient disturbance events. The output of the proposed on-chip transient detection circuit can be used as a firmware index to execute the system recovery procedure. With hardware/firmware codesign, the transient disturbance immunity of microelectronic products equipped with CMOS integrated circuits under system-level ESD or EFT tests can be significantly improved.
Keywords :
CMOS integrated circuits; SPICE; electrostatic discharge; hardware-software codesign; integrated circuit testing; silicon; system-on-chip; transient analysis; transients; CMOS integrated circuits; HSPICE simulation; Si; complementary-metal-oxide-semiconductor process; electrical-fast-transient testing; hardware-firmware codesign; on-chip protection design; silicon chip; size 0.18 mum; system recovery procedure; system-level electrical-transient disturbance; system-level electrostatic-discharge; transient detection circuit; CMOS memory circuits; CMOS process; Circuit simulation; Circuit testing; Electrostatic discharge; Microprogramming; Protection; Silicon; System testing; System-on-a-chip; Electrical-fast-transient (EFT) test; electromagnetic compatibility; electrostatic discharge (ESD); system-level ESD test; transient detection circuit;
Journal_Title :
Industrial Electronics, IEEE Transactions on
DOI :
10.1109/TIE.2009.2039456
