DocumentCode :
1403838
Title :
A 0.33-V, 500-kHz, 3.94- \\mu\\hbox {W} 40-nm 72-Kb 9T Subthreshold SRAM With Ripple Bit-Line Structure and Negative Bit-Line Write-Assist
Author :
Chien-Yu Lu ; Ming-Hsien Tu ; Hao-I Yang ; Ya-Ping Wu ; Huan-Shun Huang ; Yuh-Jiun Lin ; Kuen-Di Lee ; Yung-Shin Kao ; Ching-Te Chuang ; Shyh-Jye Jou ; Wei Hwang
Author_Institution :
Dept. of Electron. Eng. & Inst. of Electron., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Volume :
59
Issue :
12
fYear :
2012
Firstpage :
863
Lastpage :
867
Abstract :
This paper presents an ultra-low-power 72-Kb 9T static random-access memory (SRAM) with a ripple bit-line (RPBL) structure and negative bit-line (NBL) write-assist. The RPBL scheme provides over 40% read access performance improvement for VDD below 0.4 V compared with the conventional hierarchical bit-line structure. A variation-tolerant ripple-initiated NBL write-assist scheme with the transient negative pulse coupled only into the single selected local bit-line segment is employed to enhance the NBL, boosting efficiency and reducing power consumption. The 331 × 385 μm2 72-Kb SRAM macro has been fabricated in UMC 40-nm low-power CMOS technology and was tested with full suites of SRAM compiler qualification patterns. Error-free full functionality without redundancy is achieved from 1.5 V down to 0.33 V. The measured maximum operation frequency is 220 MHz (500 kHz) at 1.1 V (0.33 V) and 25 °C. The measured total power consumption is 3.94 μW at 0.33 V, 500 kHz, and 25 °C .
Keywords :
CMOS memory circuits; SRAM chips; integrated circuit testing; CMOS technology; RPBL; SRAM compiler qualification patterns; boosting efficiency; frequency 220 MHz; frequency 500 kHz; memory size 72 KByte; negative bit-line write-assist; power 3.94 muW; read access performance improvement; ripple bit-line structure; ripple-initiated NBL write-assist scheme; size 40 nm; temperature 25 degC; ultra-low-power 9T subthreshold SRAM; voltage 0.33 V; voltage 1.1 V; voltage 1.5 V; CMOS integrated circuits; CMOS technology; Computer architecture; Low voltage; Microprocessors; Random access memory; Solid state circuits; 9T SRAM cell; Negative bit-line (NBL); ripple bit-line (RPBL); subthreshold static random-access memory (SRAM); ultra-low voltage;
fLanguage :
English
Journal_Title :
Circuits and Systems II: Express Briefs, IEEE Transactions on
Publisher :
ieee
ISSN :
1549-7747
Type :
jour
DOI :
10.1109/TCSII.2012.2231017
Filename :
6423268
Link To Document :
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