A generalized approach to optical low-coherence reflectometry including spectral filtering effects

Author

Wiedmann, Uwe ; Gallion, Philippe ; Duan, Guang-Hua

Author_Institution

Dept. Commun., Ecole Nat. Superieure des Telecommun., Paris, France

Volume

16

Issue

7

fYear

1998

fDate

7/1/1998 12:00:00 AM

Firstpage

1343

Lastpage

1347

Abstract

In the interpretation of optical low-coherence reflectometry measurements, the reflectivity of the device under test is in general supposed to be with a slow dependency on optical wavelength. However, recent research aims at investigating strongly wavelength-dependent devices, such as fiber Bragg gratings and semiconductor lasers. In this paper, a general theory including spectral filtering effects is developed. It appears as a generalization of previously reported results only valid under special conditions

Keywords

diffraction gratings; light coherence; measurement theory; optical filters; optical testing; reflectivity; reflectometry; semiconductor lasers; device under test; fiber Bragg gratings; generalized approach; optical filters; optical low-coherence reflectometry; optical wavelength; semiconductor lasers; slow dependency; special conditions; spectral filtering effects; strongly wavelength-dependent devices; Fiber lasers; Filtering theory; Laser theory; Optical devices; Optical filters; Reflectivity; Reflectometry; Semiconductor lasers; Testing; Wavelength measurement;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.701415

Filename

701415