A finite differences method for the reconstruction of refractive index profiles from near-field measurements

Author

Caccavale, Federico ; Segato, Francesco ; Mansour, Ibrahim ; Gianesin, Massimiliano

Author_Institution

Dipt. di Fisica, Padova Univ., Italy

Volume

16

Issue

7

fYear

1998

fDate

7/1/1998 12:00:00 AM

Firstpage

1348

Lastpage

1353

Abstract

A new method for the reconstruction of refractive index profiles of optical waveguides from the intensity profile of the fundamental mode, as measured with near field (NF) technique, is presented. In this procedure, an analytical expression of the index profile as function of some parameters such as the maximum index variation and depth is given. By a finite differences (FD) algorithm, the wave equation is solved in order to find the effective index and the intensity profile of the fundamental mode. The input parameters are then varied in order to minimize the difference between the measured intensity profiles and the calculated ones. An application of the method to the special case of planar Ti:Mg:LiNbO₃ waveguides is presented

Keywords

finite difference methods; lithium compounds; magnesium; optical noise; optical planar waveguides; optical testing; optical waveguide theory; refractive index; titanium; LiNbO₃:Ti,Mg; effective index; finite differences algorithm; finite differences method; fundamental mode; input parameters; intensity profile; maximum index variation; measured intensity profiles; near field technique; near-field measurements; optical waveguides; planar Ti:Mg:LiNbO₃ waveguides; refractive index profile reconstruction; wave equation; Finite difference methods; Integrated optics; Noise measurement; Optical devices; Optical interferometry; Optical noise; Optical refraction; Optical variables control; Optical waveguides; Refractive index;

fLanguage

English

Journal_Title

Lightwave Technology, Journal of

Publisher

ieee

ISSN

0733-8724

Type

jour

DOI

10.1109/50.701416

Filename

701416