DocumentCode :
1404546
Title :
Resolution of Diagnosis Based on Transition Faults
Author :
Pomeranz, Irith ; Reddy, Sudhakar M.
Author_Institution :
Sch. of Electr. & Comput. Eng., Purdue Univ., West Lafayette, IN, USA
Volume :
20
Issue :
1
fYear :
2012
Firstpage :
172
Lastpage :
176
Abstract :
The conventional detection conditions for transition faults do not predict fault effects that may be created when transition faults are activated and/or propagated by pulses (or hazards). For this, detection conditions that take hazards into consideration need to be used. However, since the occurrence of pulses cannot be predicted accurately based on a gate-level circuit description, the transition fault model becomes more susceptible to pattern-dependent effects, where errors on observed outputs that are predicted by the fault model may not appear in a circuit-under-diagnosis. This paper considers the implications of these pattern-dependent effects on the resolution of fault diagnosis based on transition faults.
Keywords :
fault location; hazards; circuit under diagnosis; conventional detection conditions; fault diagnosis; fault effects; gate level circuit; pattern dependent effects; transition faults; Circuit faults; Computational modeling; Delay; Fault diagnosis; Hazards; Very large scale integration; Defect diagnosis; diagnostic resolution; hazards; transition faults;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2091975
Filename :
5668522
Link To Document :
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