Title :
TEM Study of Local Conduction Mechanisms in Model Specimens of Ag-Based Conductive Adhesive
Author :
Kurosu, Keita ; Kawamoto, Naoyuki ; Murakami, Yasukazu ; Shindo, Daisuke
Author_Institution :
Inst. of Multidiscipl. Res. for Adv. Mater., Tohoku Univ., Sendai, Japan
Abstract :
The conduction mechanisms of silver (Ag)-based conductive adhesives, which consist of metallic Ag particles and an epoxy resin, are discussed on the basis of transmission electron microscopy (TEM) studies and local conductivity measurements of model specimens. A small electrical current was observed in the model specimens, in which a thin epoxy layer was sandwiched between Ag electrodes. TEM observations demonstrated that the irreversible changes in the current versus voltage characteristics occurred along with microstructural changes in the Ag electrode, which was subjected to a large electrical current. Calculated equipotential lines indicated a considerable change in the electric field distribution near a small horn that was formed in the surface of the Ag electrode. The results provide useful information for understanding local conduction in the cured adhesive.
Keywords :
conductive adhesives; electrical conductivity; electrodes; filled polymers; resins; silver; transmission electron microscopy; Ag; TEM; cured adhesive; electric field distribution; electrical current; epoxy layer; equipotential line; local conduction; local conduction mechanism; microstructural change; silver electrode; silver-based conductive adhesive; small electrical current; transmission electron microscopy; Anodes; Cathodes; Conductive adhesives; Current; Epoxy resins; Needles; Current versus voltage $(Ihbox{--}V)$ characteristics; silver (Ag)-based conductive adhesives; transmission electron microscopy (TEM);
Journal_Title :
Components, Packaging and Manufacturing Technology, IEEE Transactions on
DOI :
10.1109/TCPMT.2011.2176734