DocumentCode :
1404642
Title :
Mechanical-Electrical Modeling of Stretching Experiment on 45 {\\rm Nb}_{3}{\\rm Sn} Strands CICCs
Author :
Torre, A. ; Bajas, H. ; Ciazynski, D. ; Durville, D. ; Weiss, K.
Author_Institution :
GCRY Group, Commissariat a l´´Energie Atomique-Cadarache, St. Paul-lez-Durance, France
Volume :
21
Issue :
3
fYear :
2011
fDate :
6/1/2011 12:00:00 AM
Firstpage :
2042
Lastpage :
2045
Abstract :
Cable-In-Conduit Conductors made with Nb3Sn strands will be used in ITER magnets. The current carrying capability of these Nb3Sn strands is known to be highly dependant on the strain state resulting from mechanical loading. The intricate cabling pattern of CICC, added to the thermal differential shrinkage between conductor jacket and Nb3Sn filaments induce complex strand trajectories and a highly inhomogeneous strain state. This “cable strain map” also evolves with operating loads (Lorentz force/hoop stress). The SAMAN experiment, conducted in the FBI facility at Karlsruhe Institute of Technology, aimed to stretch subsize, ITER-like conductors, in order to observe the evolution of the critical current associated with these loadings. The application of the Multifil finite element code, developed at Ecole Centrale de Paris, has helped quantifying the local strains along every individual strand, and their evolutions during cooldown (from heat treatment), energizing and stretching phenomena. Using Multifil output mechanical data as input in the CEA electrical code CARMEN has allowed computing the critical current in every strand, thus leading to an understanding of the critical current degradation of such subsize conductors. This paper shows, for two SAMAN samples, what is the impact of bending strain concentration on a CICC current transport capability.
Keywords :
bending; niobium alloys; plasma confinement; shrinkage; superconducting cables; tin alloys; FBI facility; ITER like conductor; ITER magnet; Lorentz force; Nb3Sn; bending strain; cable strain map; cable-in-conduit conductor; cabling pattern; hoop stress; mechanical-electrical model; multifil finite element code; stretching experiment; thermal differential shrinkage; Computational modeling; Conductors; Critical current; Degradation; Load modeling; Loading; Strain; CICC; modeling; strain; superconductor;
fLanguage :
English
Journal_Title :
Applied Superconductivity, IEEE Transactions on
Publisher :
ieee
ISSN :
1051-8223
Type :
jour
DOI :
10.1109/TASC.2010.2091385
Filename :
5668902
Link To Document :
بازگشت