• DocumentCode
    1404653
  • Title

    First observation of ballistic holes in a p-type THETA device

  • Author

    Heiblum, M. ; Seo, Kazuyuki ; Meier, H.P. ; Hickmott, T.W.

  • Author_Institution
    IBM Thomas J. Watson Res. Center, Yorktown Heights, NY
  • Volume
    35
  • Issue
    12
  • fYear
    1988
  • fDate
    12/1/1988 12:00:00 AM
  • Firstpage
    2428
  • Abstract
    Novel p-type tunneling hot electron transfer amplifier (THETA) devices have been fabricated for the first time. A tunnel injector is used to separate the light holes from the heavy ones. In the present case, in p GaAs doped to 2×1018 cm-3, the fraction of light holes is only about 6%. After tunneling through a 10-nm-thick AlGaAs barrier, 0.2-eV high, the current due to light holes is more than 104 times greater than that due to the heavy holes. This method of injection has been used to launch primarily light holes into a 30-nm p-GaAs layer, doped as above, and performed energy spectroscopy with another, relatively thick, AlGaAs spectrometer barrier at the exit. It was found that 10% of the injected holes traversed the GaAs layer and the spectrometer ballistically with narrow energy distributions, 35-meV wide. The nature of the ballistic transport was also independently verified to be due to the light holes. This was done through the observation of quantum interference effects of the ballistic holes in the thin GaAs base. The results show that p-type ballistic devices with performance potential approaching that of n-type devices may be possible
  • Keywords
    III-V semiconductors; aluminium compounds; gallium arsenide; high field effects; hot electron transistors; solid-state microwave devices; 0.2 eV; 10 nm; 10 percent; 30 nm; AlGaAs spectrometer barrier; AlGaAs-GaAs; THETA; ballistic holes; ballistic transport; light holes; narrow energy distributions; observation; observation of ballistic holes; p-type THETA device; p-type ballistic devices; quantum interference effects; tunnel injector; tunneling hot electron transfer amplifier; Ballistic transport; Bandwidth; Charge carrier processes; Electronics cooling; Electrons; Gallium arsenide; Optical amplifiers; Organic materials; Spectroscopy; Tunneling;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.8828
  • Filename
    8828