DocumentCode :
1404689
Title :
A self-aligned gate GaAs MESFET with p-pocket layers for high-efficiency linear power amplifiers
Author :
Nishihori, Kazuya ; Kitaura, Yoshiaki ; Hirose, Mayumi ; Mihara, Masakatsu ; Nagaoka, Masami ; Uchitomi, Naotaka
Author_Institution :
Res. & Dev. Center, Toshiba Corp., Kawasaki, Japan
Volume :
45
Issue :
7
fYear :
1998
fDate :
7/1/1998 12:00:00 AM
Firstpage :
1385
Lastpage :
1392
Abstract :
This paper describes a newly developed GaAs metal semiconductor field-effect transistor (MESFET)-termed p-pocket MESFET-for use as a linear power amplifier in personal handy-phone systems. Conventional buried p-layer technology, the primary technology for microwave GaAs power MESFET´s, has a drawback of low power efficiency for linear power applications. The low power efficiency of the buried p-layer MESFET is ascribed to the I-V kink which is caused by holes collected in the buried p-layer under the channel. In order to overcome this problem, we have developed the self-aligned gate p-pocket MESFET which incorporates p-layers not under the channel but under the source and drain regions. This new MESFET exhibited high transconductance and uniform threshold voltage. The problematic I-V kink was successfully removed and an improved power efficiency of 48% was achieved under bias conditions, which resulted in adjacent channel leakage power at 600-kHz offset as low as -59 dBc for 1.9-GHz π/4-shift QPSK modulated input
Keywords :
III-V semiconductors; UHF field effect transistors; UHF power amplifiers; gallium arsenide; power MESFET; π/4-shift QPSK modulation; 1.9 GHz; 48 percent; GaAs; I-V kink; Personal Handy Phone system; adjacent channel leakage power; linear power amplifier; p-pocket layer; power efficiency; self-aligned gate GaAs MESFET; threshold voltage; transconductance; FETs; Gallium arsenide; High power amplifiers; Linearity; MESFETs; Microwave technology; Quadrature phase shift keying; Semiconductor optical amplifiers; Threshold voltage; Transconductance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.701466
Filename :
701466
Link To Document :
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