DocumentCode :
1404858
Title :
A critical evaluation of the effective diffusion length determination in crystalline silicon solar cells from an extended spectral analysis
Author :
Keller, Steffen ; Spiegel, Markus ; Fath, Peter ; Willeke, Gerhard P. ; Bucher, Ernst
Author_Institution :
Fak. fur Phys., Konstanz Univ., Germany
Volume :
45
Issue :
7
fYear :
1998
fDate :
7/1/1998 12:00:00 AM
Firstpage :
1569
Lastpage :
1574
Abstract :
This note draws attention to possible errors when characterizing silicon solar cells by means of the effective minority carrier diffusion length Lb as defined in the paper on “Numerical modeling of textured silicon solar cells using PC1D” by Basore (1990). The approximations underlying the analytical expression for L eff are critically reviewed. Their impact on the determination of the minority carrier bulk diffusion length Lb from Leff is discussed for a 250-μm thick Si solar cell. It is found that considerable errors occur in the case of diffusion lengths larger than the cell thickness even when neglecting any measurement uncertainty
Keywords :
carrier lifetime; elemental semiconductors; minority carriers; silicon; solar cells; spectral analysis; PC1D; Si; measurement errors; minority carrier diffusion length; numerical model; spectral analysis; textured crystalline silicon solar cell; Crystallization; Measurement uncertainty; Photovoltaic cells; Radiative recombination; Short circuit currents; Silicon; Solar power generation; Space charge; Spectral analysis; Velocity measurement;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.701490
Filename :
701490
Link To Document :
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