• DocumentCode
    1404996
  • Title

    Reliability of Data Centers by Tier Classification

  • Author

    Arno, Robert ; Friedl, Addam ; Gross, Peter ; Schuerger, Robert J.

  • Author_Institution
    HP Critical Facility Services, Frankfort, NY, USA
  • Volume
    48
  • Issue
    2
  • fYear
    2012
  • Firstpage
    777
  • Lastpage
    783
  • Abstract
    When the concept of reliability began to formally become an integrated engineering approach in the 50s, reliability was associated with failure rate. Today the term “reliability” is used as an umbrella definition covering a variety of subjects including availability, durability, quality, and sometimes the function of the product. Reliability engineering was developed to quantify “how reliable” a component, product, or system was when used in a specific application for a specific period of time. The data center industry has come to rely on “tier classifications” as presented in a number of papers by the Uptime Institute as a gradient scale of data center configurations and requirements from least (Tier 1) to most reliable (Tier 4). This paper will apply the principles and modeling techniques of reliability engineering to specific examples of each of the tier classifications and discuss the results. A review of the metrics of reliability engineering being used will also be included.
  • Keywords
    computer centres; durability; reliability; data center configuration; data center industry; data center reliability; failure rate; integrated engineering approach; product availability; product durability; product quality; reliability engineering; tier classification; Availability; Generators; Maintenance engineering; Reliability engineering; Switches; Uninterruptible power systems; Availability; component; failure rate; mean time between failures (MTBF); mean time to repair (MTTR); reliability;
  • fLanguage
    English
  • Journal_Title
    Industry Applications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-9994
  • Type

    jour

  • DOI
    10.1109/TIA.2011.2180872
  • Filename
    6111281