• DocumentCode
    1405287
  • Title

    BIST structure for DAC testing

  • Author

    Wen, Yun-Che ; Lee, Kuen-Jong

  • Author_Institution
    Dept. of Electr. Eng., Nat. Cheng Kung Univ., Tainan, Taiwan
  • Volume
    34
  • Issue
    12
  • fYear
    1998
  • fDate
    6/11/1998 12:00:00 AM
  • Firstpage
    1173
  • Lastpage
    1174
  • Abstract
    A built-in self-test (BIST) structure for digital-to-analogue converter (DAC) testing is presented. The basic idea is to divide the input codes (0, 1, ..., 2n-1) of the DAC under test into a number of segments. The DAC output voltages corresponding to different codes in the same segment are amplified to the same voltage value. Such that one single reference voltage can be used to test all codes in the same segment. By this method, the number of reference voltages required for DAC testing can be greatly reduced. We show that offset error, gain error, integral nonlinearity (INL) and differential nonlinearity (DNL) are effectively detected in the proposed BIST structure
  • Keywords
    automatic testing; built-in self test; digital-analogue conversion; integrated circuit testing; BIST structure; DAC output voltages; DAC testing; built-in self-test structure; differential nonlinearity; digital/analogue converter; gain error; integral nonlinearity; offset error; single reference voltage;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19980874
  • Filename
    702351
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1405287