DocumentCode :
1405343
Title :
High-performance submicrometer channel MOSFETs for analog applications
Author :
Antoniadis, Dimitri A.
Volume :
35
Issue :
12
fYear :
1988
fDate :
12/1/1988 12:00:00 AM
Firstpage :
2430
Lastpage :
2431
Abstract :
The authors report the design and fabrication of a submicrometer-channel-length DMOS transistor that offers a significant increase in r0, a higher gm, an increase in breakdown voltage, and a reduced body effect when compared to regular NMOS transistors. The cost of integration of this device is two mask steps and two implants. Only photoresist patterning is required, and the process temperature budget is easily accommodated by any CMOS process
Keywords :
CMOS integrated circuits; insulated gate field effect transistors; semiconductor technology; CMOS process; DMOS transistor; analog applications; breakdown voltage; implants; mask steps; photoresist patterning; process temperature budget; reduced body effect; submicrometer-channel-length; transconductance; Boron; Doping; FETs; Glass; Immune system; MOS devices; MOSFETs; Parasitic capacitance; Passivation; Transconductance;
fLanguage :
English
Journal_Title :
Electron Devices, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9383
Type :
jour
DOI :
10.1109/16.8834
Filename :
8834
Link To Document :
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