DocumentCode
1405726
Title
Simple parameter extraction method for non-ideal Schottky barrier diodes
Author
Lee, J.I. ; Brini, J. ; Dimitriadis, C.A.
Author_Institution
Lab. de Phys. des Composants a Semicond., ENSERG, Grenoble, France
Volume
34
Issue
12
fYear
1998
fDate
6/11/1998 12:00:00 AM
Firstpage
1268
Lastpage
1269
Abstract
Simple, on-site parameter extraction methods are proposed; the ideality factor, series resistance, leakage resistance and saturation current are determined from the current-voltage characteristics of a Schottky barrier diode
Keywords
Schottky diodes; electric resistance; leakage currents; semiconductor device testing; current-voltage characteristics; ideality factor; leakage resistance; nonideal Schottky barrier diodes; parameter extraction method; saturation current; series resistance;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
DOI
10.1049/el:19980831
Filename
702418
Link To Document