• DocumentCode
    140612
  • Title

    Adaptive automatic segmentation of leishmaniasis parasite in indirect immunofluorescence images

  • Author

    Ouertani, F. ; Amiri, Hamid ; Bettaib, J. ; Yazidi, R. ; Ben Salah, A.

  • Author_Institution
    Signal, Images & Inf. Technol. Dept. (LR-SITI-ENIT), Nat. Sch. of Eng. in Tunis, Tunis, Tunisia
  • fYear
    2014
  • fDate
    26-30 Aug. 2014
  • Firstpage
    4731
  • Lastpage
    4734
  • Abstract
    This paper describes the first steps for the automation of the serum titration process. In fact, this process requires an Indirect Immunofluorescence (IIF) diagnosis automation. We deal with the initial phase that represents the fluorescence images segmentation. Our approach consists of three principle stages: (1) a color based segmentation which aims at extracting the fluorescent foreground based on k-means clustering, (2) the segmentation of the fluorescent clustered image, and (3) a region-based feature segmentation, intended to remove the fluorescent noisy regions and to locate fluorescent parasites. We evaluated the proposed method on 40 IIF images. Experimental results show that such a method provides reliable and robust automatic segmentation of fluorescent Promastigote parasite.
  • Keywords
    biomedical optical imaging; fluorescence; image segmentation; medical image processing; microorganisms; IIF diagnosis automation; Leishmaniasis parasite; adaptive automatic segmentation; color based segmentation; fluorescence images segmentation; fluorescent Promastigote parasite; fluorescent clustered image; fluorescent foreground; fluorescent noisy regions; indirect immunofluorescence images; k-means clustering; region-based feature segmentation; serum titration process; Feature extraction; Fluorescence; Image color analysis; Image segmentation; Immune system; Microscopy; Noise measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
  • Conference_Location
    Chicago, IL
  • ISSN
    1557-170X
  • Type

    conf

  • DOI
    10.1109/EMBC.2014.6944681
  • Filename
    6944681