DocumentCode :
1406214
Title :
An integrated 16/spl times/16 PVDF pyroelectric sensor array
Author :
Binnie, T.David ; Weller, Harald J. ; He, Zhiqun ; Setiadi, Dadi
Author_Institution :
Sch. of Eng., Napier Polytech. of Edinburgh, UK
Volume :
47
Issue :
6
fYear :
2000
Firstpage :
1413
Lastpage :
1420
Abstract :
This paper presents a fully integrated PVDF-on-silicon pyroelectric sensor array. The pyroelectric sensor has two main features: a subpixel low noise charge amplifier and a self-absorbing layered structure. The integrated low noise charge amplifier is implemented in a standard CMOS process technology. It is located directly under the sensing structure, maximizing the pixel fill factor. The self-absorbing pyroelectric sensor is a three-layer stack, consisting of a conductive polymer as an absorber layer and front electrode, a thin PVDF film as the pyroelectric material, and a rear metal layer acting as a reflector layer and rear electrode. The manufacture of the pyroelectric sensor array requires five maskless post-CMOS processing steps and is compatible with any n-well, double metal, double polysilicon, CMOS process. The array has an average pixel voltage sensitivity of 2200 V/W at 100 Hz, an NEP of 2.4/spl times/10/sup -11/ W//spl radic/Hz at 100 Hz, and a specific detectivity of 4.4/spl times/10/sup 8/ cm /spl radic/Hz/W at 100 Hz.
Keywords :
CMOS integrated circuits; conducting polymers; ferroelectric thin films; infrared detectors; integrated optoelectronics; optical arrays; piezoelectric thin films; polymer films; pyroelectric detectors; 100 Hz; IR sensor array; NEP; Si; absorber layer; average pixel voltage sensitivity; conductive polymer; double polysilicon; front electrode; integrated 16/spl times/16 PVDF pyroelectric sensor array; integrated low noise charge amplifier; manufacture; maskless post-CMOS processing steps; pixel fill factor; pyroelectric material; rear electrode; rear metal layer; reflector layer; self-absorbing layered structure; specific detectivity; standard CMOS process technology; subpixel low noise charge amplifier; thin PVDF film; three-layer stack; CMOS process; CMOS technology; Conductive films; Electrodes; Low-noise amplifiers; Polymer films; Pyroelectricity; Sensor arrays; Sensor phenomena and characterization; Thin film sensors;
fLanguage :
English
Journal_Title :
Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
Publisher :
ieee
ISSN :
0885-3010
Type :
jour
DOI :
10.1109/58.883530
Filename :
883530
Link To Document :
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