DocumentCode :
1406405
Title :
MEMS post-packaging by localized heating and bonding
Author :
Lin, Liwei
Author_Institution :
Dept. of Mech. Eng., California Univ., Berkeley, CA, USA
Volume :
23
Issue :
4
fYear :
2000
fDate :
11/1/2000 12:00:00 AM
Firstpage :
608
Lastpage :
616
Abstract :
This work addresses important post-packaging issues for microsystems and recommends specific research directions by localized heating and bonding. Micropackaging has become a major subject for both scientific research and industrial applications in the emerging field of microelectromechanical systems (MEMS). Establishing a versatile post-packaging process not only advances the field but also speeds up the product commercialization cycle. A review of engineering bases describing current technologies of MEMS packaging and wafer bonding is followed by an innovative post-packaging approach by localized heating and bonding, process demonstrations by selective encapsulation are presented, including an integrated low pressure chemical vapor deposition (LPCVD) sealing process, localized silicon-gold eutectic bonding, localized silicon-glass fusion bonding, localized solder bonding and localized CVD bonding processes.
Keywords :
chemical vapour deposition; encapsulation; micromechanical devices; seals (stoppers); semiconductor device packaging; soldering; CVD bonding; LPCVD sealing process; MEMS; eutectic bonding; fusion bonding; localized bonding; localized heating; post-packaging issues; process demonstrations; product commercialization cycle; selective encapsulation; solder bonding; Chemical technology; Chemical vapor deposition; Commercialization; Encapsulation; Heat engines; Heating; Microelectromechanical systems; Micromechanical devices; Packaging; Wafer bonding;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/6040.883749
Filename :
883749
Link To Document :
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