DocumentCode :
1406525
Title :
Kinetics of interface reaction in 40Sn-Bi/Cu and 40Sn-Bi-2Ag/Cu systems during aging in solid state
Author :
Guan, Zhuo-Ming ; Liu, Guo-Xun ; Liu, Tao
Author_Institution :
Dept. of Mater. Sci. & Eng., Univ. of Sci. & Technol. of China, Hefei, China
Volume :
23
Issue :
4
fYear :
2000
fDate :
11/1/2000 12:00:00 AM
Firstpage :
737
Lastpage :
742
Abstract :
The characteristics of thickening kinetics of the intermetallic compounds (IMC) (Cu6Sn5+Cu3Sn) during aging at 120°C and 90°C in solid state were studied by quantitative metallographic analysis for three solder alloy systems: 40Sn-Bi/Cu, 40Sn-Bi-2Ag/Cu and Sn-37Pb/Cu. The diffusion couples were prepared by hot immersion in the molten solder bath. The results showed that the rate of the IMC thickening increases in the order Sn-37Pb/Cu<40Sn-Bi/2-Ag/Cu<40Sn-Bi/Cu. The IMC thickening rate in the Sn-Bi eutectic system is one order of magnitude faster than that in Sn-Pb eutectic system. The time exponents are different from each other. The relationship between the increase of IMC and aging time follows a parabolic function in the Sn-Pb system, and a linear relation in the Sn-Bi system. Addition of Ag in Sn-Bi inhibits the IMC thickening process.
Keywords :
adhesion; ageing; bismuth alloys; chemical interdiffusion; copper; lead alloys; metallography; reaction kinetics; reflow soldering; silver alloys; surface chemistry; surface mount technology; tin alloys; 120 degC; 90 degC; Cu6Sn5+Cu3Sn; CuSn; Sn-Bi eutectic system; Sn-Bi-Ag/Cu system; Sn-Bi/Cu system; Sn-Pb eutectic system; Sn-Pb/Cu; SnBi-Cu; SnBiAg-Cu; SnPb-Cu; aging; diffusion couples; hot immersion; interface reaction kinetics; intermetallic compounds; molten solder bath; quantitative metallographic analysis; solder alloy; solid state; thickening kinetics; time exponents; Aging; Assembly; Copper alloys; Intermetallic; Kinetic theory; Materials science and technology; Soldering; Solid state circuits; Temperature; Tin;
fLanguage :
English
Journal_Title :
Advanced Packaging, IEEE Transactions on
Publisher :
ieee
ISSN :
1521-3323
Type :
jour
DOI :
10.1109/6040.883766
Filename :
883766
Link To Document :
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