DocumentCode
140680
Title
Influence of anisotropic white matter modeling on EEG source localization
Author
Cuartas-Morales, E. ; Cardenas-Pena, D. ; Castellanos-Dominguez, German
Author_Institution
Signal Process. & Recognition Group, Univ. Nac. de Colombia, Manizales, Colombia
fYear
2014
fDate
26-30 Aug. 2014
Firstpage
4920
Lastpage
4923
Abstract
We study the influence of the anisotropic white matter within the ElectroEncephaloGraphy source localization problem. To this end, we consider three cases of the anisotropic white matter modeled in two concrete cases: by fixed or variable ratio. We extract information about highly anisotropic areas of the white matter from real Diffusion Weighted Imaging data. To validate the compared anisotropic models, we introduce the localization dipole and orientation errors. Obtained results show that the white matter model with a fixed anisotropic ratio leads to values of dipole localization error close to 1cm and may be enough in those cases avoiding localized analysis of neural brain activity. In contrast, modeling based on the anisotropic variable rate assumption becomes important in tasks regarding analysis and localization of deep sources neighboring the white matter tissue.
Keywords
biodiffusion; biological tissues; biomedical MRI; electroencephalography; feature extraction; medical image processing; neurophysiology; physiological models; EEG source localization; anisotropic variable rate assumption; anisotropic white matter modeling; deep source localization; dipole localization error; electroencephalography source localization problem; fixed anisotropic ratio; information extraction; localized analysis; neural brain activity; orientation errors; real Diffusion Weighted Imaging data; variable ratio; white matter tissue; Analytical models; Brain models; Conductivity; Electric potential; Electroencephalography; Magnetic resonance imaging;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location
Chicago, IL
ISSN
1557-170X
Type
conf
DOI
10.1109/EMBC.2014.6944727
Filename
6944727
Link To Document