DocumentCode
140682
Title
Simultaneous blind separation and clustering of coactivated EEG/MEG sources for analyzing spontaneous brain activity
Author
Hirayama, Jun-ichiro ; Ogawa, Tomomi ; Hyvarinen, Aapo
Author_Institution
Cognitive Mechanisms Labs., Adv. Telecommun. Res. Inst. Int. (ATR), Kyoto, Japan
fYear
2014
fDate
26-30 Aug. 2014
Firstpage
4932
Lastpage
4935
Abstract
Analysis of the dynamics (non-stationarity) of functional connectivity patterns has recently received a lot of attention in the neuroimaging community. Most analysis has been using functional magnetic resonance imaging (fMRI), partly due to the inherent technical complexity of the electro- or magnetoencephalography (EEG/MEG) signals, but EEG/MEG holds great promise in analyzing fast changes in connectivity. Here, we propose a method for dynamic connectivity analysis of EEG/MEG, combining blind source separation with dynamic connectivity analysis in a single probabilistic model. Blind source separation is extremely useful for interpretation of the connectivity changes, and also enables rejection of artifacts. Dynamic connectivity analysis is performed by clustering the coactivation patterns of separated sources by modeling their variances. Experiments on resting-state EEG show that the obtained clusters correlate with physiologically meaningful quantities.
Keywords
biomedical MRI; blind source separation; electroencephalography; magnetoencephalography; neurophysiology; EEG signals; EEG sources; MEG signals; MEG sources; blind source separation; coactivation patterns; dynamic connectivity analysis; electroencephalography signals; fMRI; functional connectivity patterns; functional magnetic resonance imaging; magnetoencephalography signals; neuroimaging community; probabilistic model; spontaneous brain activity; Blind source separation; Brain modeling; Computational modeling; Electroencephalography; Surfaces;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location
Chicago, IL
ISSN
1557-170X
Type
conf
DOI
10.1109/EMBC.2014.6944730
Filename
6944730
Link To Document