DocumentCode :
140682
Title :
Simultaneous blind separation and clustering of coactivated EEG/MEG sources for analyzing spontaneous brain activity
Author :
Hirayama, Jun-ichiro ; Ogawa, Tomomi ; Hyvarinen, Aapo
Author_Institution :
Cognitive Mechanisms Labs., Adv. Telecommun. Res. Inst. Int. (ATR), Kyoto, Japan
fYear :
2014
fDate :
26-30 Aug. 2014
Firstpage :
4932
Lastpage :
4935
Abstract :
Analysis of the dynamics (non-stationarity) of functional connectivity patterns has recently received a lot of attention in the neuroimaging community. Most analysis has been using functional magnetic resonance imaging (fMRI), partly due to the inherent technical complexity of the electro- or magnetoencephalography (EEG/MEG) signals, but EEG/MEG holds great promise in analyzing fast changes in connectivity. Here, we propose a method for dynamic connectivity analysis of EEG/MEG, combining blind source separation with dynamic connectivity analysis in a single probabilistic model. Blind source separation is extremely useful for interpretation of the connectivity changes, and also enables rejection of artifacts. Dynamic connectivity analysis is performed by clustering the coactivation patterns of separated sources by modeling their variances. Experiments on resting-state EEG show that the obtained clusters correlate with physiologically meaningful quantities.
Keywords :
biomedical MRI; blind source separation; electroencephalography; magnetoencephalography; neurophysiology; EEG signals; EEG sources; MEG signals; MEG sources; blind source separation; coactivation patterns; dynamic connectivity analysis; electroencephalography signals; fMRI; functional connectivity patterns; functional magnetic resonance imaging; magnetoencephalography signals; neuroimaging community; probabilistic model; spontaneous brain activity; Blind source separation; Brain modeling; Computational modeling; Electroencephalography; Surfaces;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
ISSN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2014.6944730
Filename :
6944730
Link To Document :
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