Title :
Tip and sample flexibility effects on tapping mode (amplitude modulation) AFM measurements
Author :
Pishkenari, Hossein Nejat ; Meghdari, Ali
Author_Institution :
Nano-Robot. Lab., Sharif Univ. of Technol., Tehran, Iran
fDate :
12/1/2011 12:00:00 AM
Abstract :
This Letter is devoted to the investigation of the tip, substrate and particle flexibility effects on the elastic deformation, the maximum repulsive force and the topography images in tapping mode (amplitude modulation) atomic force microscopy (TM-AFM). Several quantitative comparisons among the different models are presented and the effects of the elastic deformations on TM-AFM measurement are investigated.
Keywords :
amplitude modulation; atomic force microscopy; elastic deformation; surface topography; atomic force microscopy; elastic deformation; repulsive force; sample flexibility effect; tapping mode AFM measurement; topography;
Journal_Title :
Micro & Nano Letters, IET
DOI :
10.1049/mnl.2011.0540
