• DocumentCode
    1406942
  • Title

    High-aspect-ratio micromachining via deep X-ray lithography

  • Author

    Guckel, H.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Wisconsin Univ., Madison, WI, USA
  • Volume
    86
  • Issue
    8
  • fYear
    1998
  • fDate
    8/1/1998 12:00:00 AM
  • Firstpage
    1586
  • Lastpage
    1593
  • Abstract
    High-aspect-ratio microsystems technology (HARMST) can be implemented by using thick photoresist technology, which requires X-ray photons for exposure. This was first realized in Germany via the so-called LIGA process. To make this process cost effective, exposures with high-energy photons were introduced in 1993 via a University of Wisconsin-Brookhaven National Laboratory cooperation. The addition of a solvent bonded resist technology and replanarization after electroplating and X-ray mask aligning yield a HARMST processing sequence that uses large-area, sequential X-ray masks without diaphragms. This technology may be applied to precision engineered parts which do not involve electronics. The processing sequence is also used for high performance linear and rotational, magnetic and electrostatic actuators. System applications in optics involve spectrometers and other devices. A discussion of US and world wide efforts in HARMST points at increasing demands for this type of processing tool
  • Keywords
    X-ray lithography; micromachining; HARMST; LIGA process; X-ray mask; deep X-ray lithography; electroplating; electrostatic actuator; high-aspect-ratio micromachining; magnetic actuator; microelectromechanical device; optical spectrometer; photoresist; precision engineering; replanarization; solvent bonded resist; Bonding; Costs; Electrostatic actuators; Laboratories; Micromachining; Optical devices; Photonics; Resists; Solvents; X-ray lithography;
  • fLanguage
    English
  • Journal_Title
    Proceedings of the IEEE
  • Publisher
    ieee
  • ISSN
    0018-9219
  • Type

    jour

  • DOI
    10.1109/5.704264
  • Filename
    704264