DocumentCode :
140709
Title :
Performance analysis of a Principal Component Analysis ensemble classifier for Emotiv headset P300 spellers
Author :
Elsawy, Amr S. ; Eldawlatly, Seif ; Taher, Mohamed ; Aly, Gamal M.
Author_Institution :
Comput. & Syst. Eng. Dept., Ain Shams Univ., Cairo, Egypt
fYear :
2014
fDate :
26-30 Aug. 2014
Firstpage :
5032
Lastpage :
5035
Abstract :
The current trend to use Brain-Computer Interfaces (BCIs) with mobile devices mandates the development of efficient EEG data processing methods. In this paper, we demonstrate the performance of a Principal Component Analysis (PCA) ensemble classifier for P300-based spellers. We recorded EEG data from multiple subjects using the Emotiv neuroheadset in the context of a classical oddball P300 speller paradigm. We compare the performance of the proposed ensemble classifier to the performance of traditional feature extraction and classifier methods. Our results demonstrate the capability of the PCA ensemble classifier to classify P300 data recorded using the Emotiv neuroheadset with an average accuracy of 86.29% on cross-validation data. In addition, offline testing of the recorded data reveals an average classification accuracy of 73.3% that is significantly higher than that achieved using traditional methods. Finally, we demonstrate the effect of the parameters of the P300 speller paradigm on the performance of the method.
Keywords :
brain-computer interfaces; electroencephalography; feature extraction; principal component analysis; signal classification; BCI; EEG data processing method; Emotiv headset P300 spellers; Emotiv neuroheadset; PCA ensemble classifier; brain-computer interfaces; classifier method; feature extraction; mobile device; oddball P300 speller paradigm; principal component analysis; Accuracy; Electroencephalography; Feature extraction; Principal component analysis; Support vector machine classification; Testing; Training;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
ISSN :
1557-170X
Type :
conf
DOI :
10.1109/EMBC.2014.6944755
Filename :
6944755
Link To Document :
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