DocumentCode :
1407436
Title :
Body-Bias-Driven Design Strategy for Area- and Performance-Efficient CMOS Circuits
Author :
Meijer, Maurice ; De Gyvez, José Pineda
Author_Institution :
Central R&D Div., NXP Semicond., Eindhoven, Netherlands
Volume :
20
Issue :
1
fYear :
2012
Firstpage :
42
Lastpage :
51
Abstract :
Worst-case design uses extreme process corner conditions which rarely occur. This limits maximum speed specifications and costs additional power due to area over-dimensioning during synthesis. We present a new design synthesis strategy for digital CMOS circuits that makes use of forward body biasing. Our approach renders consistently a better performance-per-area ratio by constraining circuit over-dimensioning without sacrificing circuit performance. An in-depth analysis of the body-bias-driven design theory is provided. It is complemented by an algorithm that enables fast reconstruction of the area-clock period tradeoff curve of the design. We validated these new concepts through industrial processor designs in 90-nm low-power CMOS. For standard- Vth implementations, we observed performance-per-area improvements up to 40%, area and leakage reductions up to 30%, and dynamic power savings of up to 10% without performance penalties as a benefit from our proposed body-bias-driven design strategy. The benefits are larger for high-Vth implementations. In this case, we observed performance-per-area improvements up to 90%, area and leakage reductions up to 40%, and dynamic power savings of up to 25% without performance penalties.
Keywords :
CMOS digital integrated circuits; circuit optimisation; circuit tuning; logic design; area and performance efficient CMOS circuits; body bias driven design strategy; circuit optimization; circuit tuning; digital CMOS circuits; forward body biasing; industrial processor designs; size 90 nm; worst case design; CMOS integrated circuits; Clocks; Delay; Integrated circuit modeling; Logic circuits; Logic gates; Power demand; CMOS digital integrated circuits; Circuit optimization; circuit tuning; logic design;
fLanguage :
English
Journal_Title :
Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publisher :
ieee
ISSN :
1063-8210
Type :
jour
DOI :
10.1109/TVLSI.2010.2091974
Filename :
5671527
Link To Document :
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