Title :
Characterization of the Low Temperature Superconductor Niobium Carbonitride
Author :
Raine, Mark J. ; Hampshire, Damian P.
Author_Institution :
Supercond. Group, Durham Univ., Durham, UK
fDate :
6/1/2011 12:00:00 AM
Abstract :
Niobium carbonitride´s superior radiation tolerance , coupled with the recently reported increase in its upper critical magnetic field when made nanocrystalline, increases its potential importance in future technological high-field superconductor applications. The maximum transition temperature for the composition NbC0.3N0.7 is ~17.8 K and its upper critical magnetic field is ~11 T; this increases to ~12 T for the composition NbC0.2N0.8,. Using solid-state processing, we have fabricated microcrystalline bulk niobium carbonitride with a transition temperature of ~ 7.6 K. A comprehensive characterization of this material, which includes susceptibility, resistivity, magnetization, heat capacity and XRD measurements is provided. Comparisons between the heat-treated material and the same material subjected to hot isostatic pressing are made so that the values of the intrinsic fundamental properties can be identified and their sensitivities to different fabrication processes determined.
Keywords :
X-ray diffraction; carbon compounds; critical current density (superconductivity); heat treatment; hot pressing; magnetic susceptibility; magnetisation; niobium compounds; specific heat; superconducting transition temperature; type II superconductors; NbC0.3N0.7; XRD; heat capacity; heat treatment; high-field superconductor applications; hot isostatic pressing; low temperature superconductor; magnetization; microcrystalline superconductor; radiation tolerance; resistivity; solid-state processing; susceptibility; transition temperature; upper critical magnetic field; Conductivity; Heating; Materials; Niobium; Superconducting transition temperature; Temperature distribution; Temperature measurement; Carbonitride; NbCN; characterization; hot isostatic pressing; niobium;
Journal_Title :
Applied Superconductivity, IEEE Transactions on
DOI :
10.1109/TASC.2010.2095491