• DocumentCode
    1407887
  • Title

    On Pattern Recognition and Quality Control

  • Author

    Wang, Paul P.

  • Author_Institution
    Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, Mass. 01002; Department of Electrical Engineering, Duke University, Durham, N.C.
  • Issue
    4
  • fYear
    1975
  • fDate
    7/1/1975 12:00:00 AM
  • Firstpage
    470
  • Lastpage
    472
  • Abstract
    The application of pattern recognition to quality control is shown. The well-known methodology of conventional quality control is described briefly to illustrate the philosophy of quality measurement. The advantages of adopting the pattern classification approach in quality control (or quality assurance) include on-line quality monitoring without much alteration of existing conventional systems, instant diagnosis of the production process, and ultimately, automatic feedback control of the overall manufacturing process through the development of a corrective control policy.
  • Keywords
    Automatic control; Computerized monitoring; Control systems; Feedback control; Manufacturing processes; Pattern classification; Pattern recognition; Production systems; Quality assurance; Quality control;
  • fLanguage
    English
  • Journal_Title
    Systems, Man and Cybernetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9472
  • Type

    jour

  • DOI
    10.1109/TSMC.1975.5408442
  • Filename
    5408442