DocumentCode :
1407887
Title :
On Pattern Recognition and Quality Control
Author :
Wang, Paul P.
Author_Institution :
Department of Electrical and Computer Engineering, University of Massachusetts, Amherst, Mass. 01002; Department of Electrical Engineering, Duke University, Durham, N.C.
Issue :
4
fYear :
1975
fDate :
7/1/1975 12:00:00 AM
Firstpage :
470
Lastpage :
472
Abstract :
The application of pattern recognition to quality control is shown. The well-known methodology of conventional quality control is described briefly to illustrate the philosophy of quality measurement. The advantages of adopting the pattern classification approach in quality control (or quality assurance) include on-line quality monitoring without much alteration of existing conventional systems, instant diagnosis of the production process, and ultimately, automatic feedback control of the overall manufacturing process through the development of a corrective control policy.
Keywords :
Automatic control; Computerized monitoring; Control systems; Feedback control; Manufacturing processes; Pattern classification; Pattern recognition; Production systems; Quality assurance; Quality control;
fLanguage :
English
Journal_Title :
Systems, Man and Cybernetics, IEEE Transactions on
Publisher :
ieee
ISSN :
0018-9472
Type :
jour
DOI :
10.1109/TSMC.1975.5408442
Filename :
5408442
Link To Document :
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