• DocumentCode
    1407956
  • Title

    Comments On "Electromagnetic Analysis For Microwave FET Modeling"

  • Author

    Jansen, Rolf H.

  • Volume
    8
  • Issue
    8
  • fYear
    1998
  • Firstpage
    296
  • Lastpage
    296
  • Abstract
    The commentor states that the concept of EM-based microwave field-effect transistor (FET) modeling, as outlined in the above-named letter, is not new and has been published before. A first version was published by Jansen (1989) and includes measurement results and implementation into the commercial LINMIC+ software version 2.0, Oct. 1987. The agreement between measured and predicted FET data given there is excellent. The method of analysis, particularly the "localized access," has been used in that paper. More details, including the localized access approach (not using the same name), have been published by the same author. Finally, even a nonlinear version of the EM analysis for microwave FET modeling has been published already by the same group. References for the above are provided. It is the commentor\´s view that the only difference between the above-named work is that it uses finite-element modeling (FEM) analysis instead of other EM methods for the distributed passive part of the FET/HEMT. In replying, the original authors note the methodology applied in their letter for the modeling of a FET is actually well known, and, moreover, they have not asserted that they were the first to have developed such a solution. Also, the approach used in the original letter differs from those of Jansen\´s references because the whole passive structure of the component is characterized by a rigorous three-dimensional (3-D) finite-element method. Via this full-wave technique, one could also take into account the indirect interaction between the component and its passive circuit environment, or another component, which is not possible analyzing a complex circuit using a classical segmentation approach.
  • Keywords
    Computer aided manufacturing; Design automation; Electrodes; Electromagnetic analysis; Electromagnetic modeling; Finite element methods; HEMTs; MMICs; Microwave FETs; Software measurement;
  • fLanguage
    English
  • Journal_Title
    Microwave and Guided Wave Letters, IEEE
  • Publisher
    ieee
  • ISSN
    1051-8207
  • Type

    jour

  • DOI
    10.1109/MGWL.1998.704600
  • Filename
    704600