• DocumentCode
    1408081
  • Title

    A fabrication method for the integration of vacuum microelectronic devices

  • Author

    Zimmerman, Steven M. ; Babie, Wayne T.

  • Author_Institution
    IBM Gen. Technol. Div., Hopewell Junction, NY, USA
  • Volume
    38
  • Issue
    10
  • fYear
    1991
  • fDate
    10/1/1991 12:00:00 AM
  • Firstpage
    2294
  • Lastpage
    2303
  • Abstract
    The sharply pointed tip of the emitter is the only physical structure in typical field emission vacuum microelectronic devices that is not commonly produced by standard integrated circuit fabrication processes. The authors suggest the use of a cusp which naturally forms when a hole is filled with a conformal film, as a mold to create the sharply pointed emitter. Not only is this tip formation method easily integrated with standard semiconductor processes to produce cathodes, diodes, triodes, and higher number electrode devices, but it is also self-aligned to all of the electrodes within the device structure. The authors describe the basic process sequence used to create a microtriode device and then show how the process can be altered to produce different numbers of electrodes and freestanding cathode structures. Preliminary experimental results are described and estimates of process reproducibility are analyzed and discussed
  • Keywords
    cathodes; electron field emission; etching; vacuum microelectronics; conformal film; cusp; diodes; electrodes; fabrication method; field emission; freestanding cathode structures; microtriode device; mold; pointed tip; self-aligned; sharply pointed emitter; standard semiconductor processes; triodes; vacuum microelectronic devices; Cathodes; Crystalline materials; Electrodes; Etching; Fabrication; Microelectronics; Pediatrics; Silicon; Substrates; Vacuum technology;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/16.88513
  • Filename
    88513