Sealed vacuum devices: fluorescent microtip displays

Author

Ghis, A. ; Meyer, R. ; Rambaud, P. ; Levy, F. ; Leroux, T.

Volume

38

Issue

10

fYear

1991

fDate

10/1/1991 12:00:00 AM

Firstpage

2320

Lastpage

2322

Abstract

Emission uniformity and reliability are critical to the successful application of vacuum microelectronics to flat-panel displays. The authors discuss two techniques that address these issues. The first technique uses a series resistance to limit tip current and the second involves the partitioning of the emitting tips. Used together, they have caused a substantial improvement in current uniformity. A real averaging effect among tips has been achieved by adding a resistive layer. The structure has been hardened to shorts with a hemstitched electrode. These improvements have led to the demonstration of emission homogeneity and stability across a 6-in diagonal substrate

Keywords

display instrumentation; electron field emission; flat panel displays; reliability; vacuum microelectronics; 6 in; VFDs; averaging effect among tips; current uniformity; demonstration; emission homogeneity; emission uniformity; flat-panel displays; fluorescent microtip displays; hardened to shorts; hemstitched electrode; partitioning of emitting tips; reliability; resistive layer; sealed vacuum devices; series resistance; stability; vacuum fluorescent displays; vacuum microelectronics; Anodes; Cathodes; Displays; Electrodes; Fluorescence; Glass; Microelectronics; Phosphors; Stripline; Voltage;

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/16.88518

Filename

88518