Analysis of E-H plane tee junction using a variational formulation

Author

Das, B.N. ; Sarma, N. V S Narasimha

Author_Institution

Dept. of Electron. & Electr. Commun. Eng., Indian Inst. of Technol., Kharagpur, India

Volume

39

Issue

10

fYear

1991

fDate

10/1/1991 12:00:00 AM

Firstpage

1770

Lastpage

1773

Abstract

A three-port equivalent network for an E-H plane tee junction is determined taking into account the effect of waveguide wall thickness and considering the contribution of the dominant mode to the imaginary part of the self-reaction. The parameters of the three-port equivalent network are determined. From a knowledge of the equivalent network parameters, the net impedance loading, reflection coefficient, and coupling are evaluated for an E-H plane tee junction. A comparison between theoretical and experimental results is also presented

Keywords

equivalent circuits; variational techniques; waveguide couplers; E-H plane tee junction; coupling; dominant mode; net impedance loading; network parameters; reflection coefficient; three-port equivalent network; variational formulation; waveguide wall thickness; Admittance; Coplanar transmission lines; Couplings; Energy storage; Impedance; Planar waveguides; Reflection; Transmission line theory; Waveguide components; Waveguide junctions;

fLanguage

English

Journal_Title

Microwave Theory and Techniques, IEEE Transactions on

Publisher

ieee

ISSN

0018-9480

Type

jour

DOI

10.1109/22.88551

Filename

88551