• DocumentCode
    1408875
  • Title

    Automated Design Debugging With Abstraction and Refinement

  • Author

    Safarpour, Sean ; Veneris, Andreas

  • Author_Institution
    Vennsa Technol., Inc., Toronto, ON, Canada
  • Volume
    28
  • Issue
    10
  • fYear
    2009
  • Firstpage
    1597
  • Lastpage
    1608
  • Abstract
    Design debugging is one of the major remaining manual processes in the semiconductor design cycle. Despite recent advances in the area of automated design debugging, more effort is required to cope with the size and complexity of today´s designs. This paper introduces an abstraction and refinement methodology to enable current debuggers to operate on designs that are orders of magnitude larger than otherwise possible. Two abstraction techniques are developed with the goals of improving debugger performance for different circuit structures: State abstraction is aimed at reducing the problem size for circuits consisting purely of primitive gates, while function abstraction focuses on designs that also contain modular and hierarchical information. In both methods, after an initial abstracted model is created, the problem can be solved by an existing automated debugger. If an error site is abstracted, refinement is necessary to reintroduce some of the abstracted components back into the design. This paper also presents the underlying theory to guarantee correctness and completeness of a debugging tool that operates using the proposed methodology. Empirical results demonstrate improvements in run time and memory capacity of two orders of magnitude over a state-of-the-art debugger on a wide range of benchmark and industrial designs.
  • Keywords
    VLSI; circuit complexity; integrated circuit design; abstraction techniques; automated design debugging; circuit complexity; circuit structures; function abstraction; memory capacity; refinement methodology; semiconductor design cycle; state abstraction; very large scale integration; Abstraction; debugging; diagnosis; refinement; verification; very large scale integration;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2009.2030593
  • Filename
    5247156