Title : 
Two Algorithms for Multiple-View Binary Pattern Reconstruction
         
        
            Author : 
Chang, S. ; Shelton, G. L.
         
        
            Author_Institution : 
IBM Thomas J. Watson Res. Center, Yorktown Heights, N. Y. 10598
         
        
        
        
        
        
            Abstract : 
The problem of reconstructing binary patterns from their shadows or projections is treated. Two algorithms are formulated. For the two-view case, both algorithms give a perfect reconstruction if and only if the pattern is two-view unambiguous. It is also shown that n views are sufficient, but not necessary, to reconstruct any n à n binary pattern. Experimental results for the four-view reconstruction of 25 à 25 binary patterns indicate that one of the algorithms has good convergency behavior.
         
        
            Keywords : 
Equations; Pattern recognition;
         
        
        
            Journal_Title : 
Systems, Man and Cybernetics, IEEE Transactions on
         
        
        
        
        
            DOI : 
10.1109/TSMC.1971.5408614