DocumentCode
140897
Title
Local patch reconstruction framework for optic cup localization in glaucoma detection
Author
Yanwu Xu ; Ying Quan ; Yi Huang ; Ngan MengTan ; Ruoying Li ; Lixin Duan ; Lin Chen ; Huiying Liu ; Xiangyu Chen ; Wong, Damon Wing Kee ; Baskaran, Mani ; Perera, Sarath ; Tin Aung ; Tien Yin Wong ; Jiang Liu
Author_Institution
Inst. for Infocomm Res., Agency for Sci., Technol. & Res., Singapore, Singapore
fYear
2014
fDate
26-30 Aug. 2014
Firstpage
5418
Lastpage
5421
Abstract
Optic cup localization/segmentation has attracted much attention from medical imaging researchers, since it is the primary image component clinically used for identifying glaucoma, which is a leading cause of blindness. In this work, we present an optic cup localization framework based on local patch reconstruction, motivated by the great success achieved by reconstruction approaches in many computer vision applications recently. Two types of local patches, i.e. grids and superpixels are used to show the variety, generalization ability and robustness of the proposed framework. Tested on the ORIGA clinical dataset, which comprises of 325 fundus images from a population-based study, both implementations under the proposed frameworks achieved higher accuracy than the state-of-the-art techniques.
Keywords
biomedical optical imaging; computer vision; diseases; eye; image reconstruction; image segmentation; medical image processing; vision defects; ORIGA clinical dataset; blindness; computer vision applications; fundus images; generalization ability; glaucoma detection; grids; local patch reconstruction framework; medical imaging researchers; optic cup localization framework; optic cup localization/segmentation; population-based study; primary image component; superpixels; Accuracy; Biomedical optical imaging; Image reconstruction; Image segmentation; Optical imaging; Robustness;
fLanguage
English
Publisher
ieee
Conference_Titel
Engineering in Medicine and Biology Society (EMBC), 2014 36th Annual International Conference of the IEEE
Conference_Location
Chicago, IL
ISSN
1557-170X
Type
conf
DOI
10.1109/EMBC.2014.6944851
Filename
6944851
Link To Document